Applications of High-Field and Short Wavelength Sources

  • Louis DiMauro
  • Margaret Murnane
  • Anne L’Huillier

Table of contents

  1. Front Matter
    Pages i-x
  2. High-Power Laser Sources

    1. M. D. Perry, B. C. Stuart, D. Pennington, G. Tietbohl, J. Britten, C. Brown et al.
      Pages 1-9
    2. Fiorenzo G. Omenetto, Keith Boyer, Tom Nelson, James W. Longworth, W. A. Schroeder, C. K. Rhodes
      Pages 11-15
    3. Sterling Backus, Charles G. Durfee III, Henry C. Kapteyn, Margaret M. Murnane
      Pages 17-21
    4. J.-F. Ripoche, B. S. Prade, M. A. Franco, G. Grillon, R. Lange, A. Mysyrowicz
      Pages 23-27
  3. Ultrafast Coherent UV and X-Ray Sources

    1. J. J. Rocca, F. G. Tomasel, J. L. A. Chilla, M. C. Marconi, V. N. Shlyaptsev, C. H. Moreno et al.
      Pages 29-38
    2. M. B. Gaarde, C. Altucci, M. Bellini, T. W. Hänsch, A. L’Huillier, C. Lyngå et al.
      Pages 39-44
    3. Andy Rundquist, Zenghu Chang, Haiwen Wang, Erik Zeek, Margaret Murnane, Henry Kapteyn
      Pages 45-51
    4. A. Bouhal, G. Hamoniaux, A. Mysyrowicz, A. Antonetti, P. Salières, P. Breger et al.
      Pages 53-58
    5. G. J. Tallents, J. Y. Lin, J. Zhang, A. Behjat, A. Demir, M. M. Güzelgöz et al.
      Pages 59-64
    6. Charles G. Durfee III, Sterling Backus, Margaret M. Murnane, Henry C. Kapteyn
      Pages 71-77
    7. H. R. Lange, A. A. Chiron, A. Bouhal, J.-F. Ripoche, P. Breger, P. Agostini et al.
      Pages 79-83
  4. Novel Short Wavelength Sources

    1. Christopher M. DePriest, David S. Torres, Martin C. Richardson
      Pages 93-96
    2. A. V. Kim, M. D. Chernobrovtseva, D. V. Kartashov, A. M. Sergeev
      Pages 97-102
    3. M. Lezius, S. Dobosz, P. d’Olivera, P. Meynadier, J.-P. Rozet, D. Vernhet et al.
      Pages 103-108
    4. A. A. Andreev, V. N. Novikov, K. Yu. Platonov, J.-C. Gauthier
      Pages 109-112
  5. Ultrashort-Pulse Laser Plasma Interactions

    1. Thomas R. Clark Jr., Sergei P. Nikitin, Yuelin Li, Howard M. Milchberg
      Pages 113-121
    2. T. Ditmire, J. W. G. Tisch, E. Springate, M. B. Mason, N. Hay, J. P. Marangos et al.
      Pages 123-130
    3. M. Nantel, G. Ma, S. Gu, C. Y. Côté, J. Itatani, D. Umstadter
      Pages 135-140
    4. V. S. Rozanov, M. C. Richardson, N. Demchenko, S. Gus’kov, D. Salzmann
      Pages 145-148
    5. E. T. Gumbrell, R. A. Smith, T. Ditmire, A. Djaoui, S. J. Rose, M. H. R. Hutchinson
      Pages 149-154
    6. V. M. Gordienko, M. A. Joukov, A. B. Savel’ev
      Pages 155-163
  6. Strong Field Interactions

    1. R. Wagner, S.-Y. Chen, A. Maksimchuk, D. Umstadter
      Pages 171-178
    2. J. L. Chaloupka, T. J. Kessler, D. D. Meyerhofer
      Pages 179-184
    3. Kenneth J. Schafer, Jeffrey L. Krause
      Pages 185-189
    4. P. L. Shkolnikov, A. E. Kaplan, S. F. Straub
      Pages 191-196
    5. Mark A. Walker, Peter Hansch, Linn D. Van Woerkom
      Pages 197-200
    6. B. Buerke, J. P. Knauer, S. J. McNaught, D. D. Meyerhofer
      Pages 201-206
    7. A. M. Sergeev, M. Lontano, M. D. Chernobrovtseva, A. V. Kim
      Pages 207-211
    8. F. V. Hartemann, E. C. Landahl, J. R. Van Meter, A. L. Troha, A. K. Kerman, N. C. Luhmann Jr.
      Pages 213-222
    9. H. Rottke, J. Ludwig, W. Sandner
      Pages 223-228
    10. B. Sheehy, B. Walker, R. Lafon, M. Widmer, L. F. Dimauro, P. Agostini et al.
      Pages 229-236
    11. L. D. Van Woerkom, S. Evans, P. Hansch, M. A. Walker
      Pages 237-244
    12. C. Szymanowski, V. Véniard, R. Taïeb, A. Maquet
      Pages 245-250
    13. H. Kotaki, K. Nakajima, M. Kando, H. Ahn, T. Watanabe, T. Ueda et al.
      Pages 251-252
  7. Applications of Short Wavelength Sources

    1. A. Bouhal, G. Hamoniaux, A. Mysyrowicz, A. Antonetti, P. Breger, P. Agostini et al.
      Pages 261-265
    2. Jörgen Larsson, Zenghu Chang, Ellen Judd, Phillip A. Heimann, Aaron M. Lindenberg, Henry C. Kapteyn et al.
      Pages 267-270
    3. M. Grätz, C. Tillman, A. Nykänen, L. Kiernan, C.-G. Wahlström, S. Svanberg et al.
      Pages 271-276
    4. Martin Richardson, Masataka Kado, David Torres, Yoshimasa Yamamoto, Herman Friedman, Jayshree Rajyaguru et al.
      Pages 277-284
    5. W. Theobald, R. Häßner, R. Sauerbrey
      Pages 285-292
    6. Valérie Véniard, Richard Taïeb, Alfred Maquet
      Pages 293-298
  8. Back Matter
    Pages 299-300

About this book


The Optical Society of America Conference on Applications of High Fields and Short Wavelength Sources, held in Santa Fe, New Mexico, USA, from March 20-22, 1997, was an exceptionally exciting conference. This conference was the seventh in a series of topical con­ ferences, held every two years, which are devoted to the generation and application of high field and short wavelength sources. The meeting was truly international in scope, with equal participation from both within and outside of the US. In the past two years, there has been dramatic progress in both laser and x-ray coher­ ent sources, both fundamental and applied. The 1997 meeting highlighted these advances, which are summarized in sections 1 and 2 of this volume. Terawatt-class lasers are now avail­ able in the UV or at high repetition rates. Michael Perry (LLNL) presented a keynote talk on petawatt class lasers and their applications in inertial confinement fusion, while Jorge Rocca (Colorado State University) presented a keynote talk on tabletop soft-x-ray lasers. Genera­ tion and measurement techniques are becoming very sophisticated throughout the UV and x­ ray region of the spectrum, and coherent sources have been extended to wavelengths below 30A. Phase control in the x-ray region is also now possible, and new phase-matching schemes in the UV have been experimentally demonstrated. It is clear that a new field of x-ray nonlin­ ear optics will deveiop rapidly over the next few years.


Phase development laser measurement techniques optics

Editors and affiliations

  • Louis DiMauro
    • 1
  • Margaret Murnane
    • 2
  • Anne L’Huillier
    • 3
  1. 1.Brookhaven National LaboratoryUptonUSA
  2. 2.University of MichiganAnn ArborUSA
  3. 3.Lund Institute of TechnologyLundSweden

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag US 1998
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-9243-0
  • Online ISBN 978-1-4757-9241-6
  • Buy this book on publisher's site