Atomic and Electronic Structure of Surfaces

Theoretical Foundations

  • Michel Lannoo
  • Paul Friedel

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 16)

Table of contents

  1. Front Matter
    Pages I-XII
  2. Michel Lannoo, Paul Friedel
    Pages 1-24
  3. Michel Lannoo, Paul Friedel
    Pages 56-82
  4. Michel Lannoo, Paul Friedel
    Pages 83-109
  5. Michel Lannoo, Paul Friedel
    Pages 110-136
  6. Michel Lannoo, Paul Friedel
    Pages 137-156
  7. Michel Lannoo, Paul Friedel
    Pages 157-199
  8. Michel Lannoo, Paul Friedel
    Pages 200-224
  9. Back Matter
    Pages 225-256

About this book


Surfaces and interfaces play an increasingly important role in today's solid state devices. In this book the reader is introduced, in a didactic manner, to the essential theoretical aspects of the atomic and electronic structure of surfaces and interfaces. The book does not pretend to give a complete overview of contemporary problems and methods. Instead, the authors strive to provide simple but qualitatively useful arguments that apply to a wide variety of cases. The emphasis of the book is on semiconductor surfaces and interfaces but it also includes a thorough treatment of transition metals, a general discussion of phonon dispersion curves, and examples of large computational calculations. The exercises accompanying every chapter will be of great benefit to the student.


Chemisorption Helium-Atom-Streuung interfaces metals semiconductors surfaces theory

Authors and affiliations

  • Michel Lannoo
    • 1
  • Paul Friedel
    • 2
  1. 1.Laboratoire d’Etudes des Surfaces et InterfacesI.S.E.N. Institut Supérieur d’Électronique du NordLille CedexFrance
  2. 2.Laboratoires D’Électronique PhilipsLimeil-Brévannes CedexFrance

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1991
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-08094-4
  • Online ISBN 978-3-662-02714-1
  • Series Print ISSN 0931-5195
  • Buy this book on publisher's site