Coherence of illumination in electron microscopy

  • H. A. Ferwerda
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 112)


Wave Function Point Spread Function Scanning Transmission Electron Microscope Object Plane Angular Spread 
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  1. 1.
    M. Born and E. Wolf: Principles of Optics, 4th ed.(Pergamon Press, Oxford 1970), Chap.10. See also the lectures by Maréchal, this volumeGoogle Scholar
  2. 2.
    H.A. Ferwerda: Optik 45, 411 (1976)Google Scholar
  3. 3.
    J. W. Goodman: Introduction to Fourier Optics (McGraw-Hill, New York 1968) pp. 44,45, where we neglected the obliquity factor which is certainly allowed in electron microscopy because of the small angular aperturesGoogle Scholar
  4. 4.
    W. Glaser: Grundlagen der Elektronenoptik (Springer, Vienna 1952), Eqn. (159-1)Google Scholar
  5. 5.
    See Ref.4, formula (180, 32)Google Scholar
  6. 6.
    H.H. Hopkins: Proc. Roy. Soc. A208, 263 (1951), ibid. A217, 408 (1953)Google Scholar
  7. 7.
    Ref.1, pp. 204, 205Google Scholar
  8. 8.
    O. Scherzer: Z. f. Physik 101, 602 (1936)Google Scholar
  9. 9.
    H.A. Ferwerda: Inverse Source Problems in Optics, H.P. Baltes, Ed. (Springer, Berlin, 1978), Chap.2. See also Groningen Univ.Theses Huiser and van Toorn(1979)Google Scholar
  10. 10.
    H.J. Butterweck: A.E.U. 31, 335 (1977)Google Scholar
  11. 11.
    H.A. Ferwerda and M.G. van Heel: Optik 47, 357 (1977)Google Scholar
  12. 12.
    J. Frank, S.C. McFarlane, K.H. Downing: Optik 52, 49 (1978) and cited referencesGoogle Scholar
  13. 13.
    Ref.3, Section 5.2Google Scholar

Copyright information

© Springer-Verlag 1980

Authors and Affiliations

  • H. A. Ferwerda
    • 1
  1. 1.Department of Applied PhysicsState University at GroningenThe Netherlands

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