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Applications of the SMOS Model to Digital Integrated Circuits

  • Christopher J. Abel
Chapter
  • 92 Downloads
Part of the The Kluwer International Series in Engineering and Computer Science book series (SECS, volume 211)

Abstract

In this section, we will apply the statistical techniques developed in the previous chapters to two important building blocks of digital integrated circuits.

Keywords

Threshold Voltage Device Size NMOS Transistor PMOS Transistor Parameter Mismatch 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1993

Authors and Affiliations

  • Christopher J. Abel

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