Applications of the SMOS Model to Digital Integrated Circuits
Part of the The Kluwer International Series in Engineering and Computer Science book series (SECS, volume 211)
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In this section, we will apply the statistical techniques developed in the previous chapters to two important building blocks of digital integrated circuits.
KeywordsThreshold Voltage Device Size NMOS Transistor PMOS Transistor Parameter Mismatch
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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© Springer Science+Business Media New York 1993