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Models for Delay Faults

  • Sudhakar M. ReddyEmail author
Chapter
Part of the Frontiers in Electronic Testing book series (FRET, volume 43)

Abstract

In this chapter fault models used to model the effects of defects causing excessive circuit delays are discussed. Methods to generate tests to detect modeled faults and design for test methods to improve fault coverage are reviewed. Current work in detecting what are called small delay defects is discussed.

Keywords

Delay faults Delay fault testing Small delay defects Design for test 

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Copyright information

© Springer Science+Business Media B.V. 2010

Authors and Affiliations

  1. 1.Department of Electrical and Computer EngineeringUniversity of IowaIowa CityUSA

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