Generalized Fault Modeling for Logic Diagnosis

  • Hans-Joachim WunderlichEmail author
  • Stefan Holst
Part of the Frontiers in Electronic Testing book series (FRET, volume 43)


To cope with the numerous defect mechanisms in nanoelectronic technology, more and more complex fault models have been introduced. Each model comes with its own properties and algorithms for test generation and logic diagnosis. In diagnosis, however, the defect mechanisms of a failing device are not known in advance, and algorithms that assume a specific fault model may fail. Therefore, diagnosis techniques have been proposed that relax fault assumptions or even work without any fault model. In this chapter, we establish a generalized fault modeling technique and notation. Based on this notation, we describe and classify existing models and investigate the properties of a fault model independent diagnosis technique.


Logic diagnosis Fault models 


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Copyright information

© Springer Science+Business Media B.V. 2010

Authors and Affiliations

  1. 1.Institut für Technische Informatik, Universität StuttgartStuttgartGermany